The SPECTRO xSORT Handheld XRF Analyzer is designed for high-throughput elemental testing and spectrochemical analysis of a wide range of metals and other materials in the field. Its speed, accuracy and ease of use set new benchmarks for handheld XRF spectrometric performance. When it comes to positive material identification equipment, SPECTRO’S handheld XRF analyzer is the ideal solution. It is also ideal for use as an environmental analyzer and for applications such as XRF RoHS testing, recycling of alloys including aluminum, precious metal analysis, plus mining and compliance screening.

For many jobs, such as material verification, the SPECTRO xSORT handheld XRF analyzer delivers highly reliable analyses in two seconds. And, for more complex matrices such as in environmental screening, SPECTRO xSORT achieves very low detection limits without the need for complex sample preparation.

The SPECTRO xSORT handheld XRF analyzer also is available with time and cost-saving features, such as an integrated video camera for precise spot testing and visual memory storage. Also available is an integrated global positioning system (GPS) that allows users to quickly retu to previously checked locations without time-wasting resurveys.

Excitation of the fluorescence radiation in the sample by an X-ray tube has been optimized so that extremely short measuring times with a high sample throughput are possible. Specially developed detector technology based on SDD allows unique analytical flexibility. With the SPECTRO xSORT it is possible to conduct laboratory-like analyses for all the important elements during analysis of rock, sediment and soil, Powders, solids, liquids, metals, etc... The installed processing and calibration modules ensure accuracies typical for SPECTRO’s laboratory XRF instruments, even for the SPECTRO xSORT. An analysis can be conducted within 30 seconds.

Features :

• Real-time elemental analysis results on the job, no matter where the job takes place
• Unparalleled speed and accuracy
• Completely non-destructive analysis
• Excellent software for data reporting and evaluation
• Light element analysis (Mg, Al, Si, P, S) without helium of vacuum purge for ultimate portability
• Large surface area SDDs (silicon drift detectors) come standard in all xSORT handheld instruments, assuring that you get the best value available in handheld XRF instrumentation